Title of article :
Observation of the critical thickness phenomenon in dislocation dynamics simulation of microbeam bending Original Research Article
Author/Authors :
C. Motz، نويسنده , , D.J. Dunstan، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2012
Pages :
7
From page :
1603
To page :
1609
Abstract :
Three-dimensional discrete dislocation dynamics simulations of thin aluminium beams in flexure give data in good agreement with critical thickness theory. The yield points (onset of significant plastic deformation) occur near the stress predicted by the theory. In the plastic regime, dislocation densities increase with plastic deformation within the bulk of the beam thickness, while the surface regions are relatively denuded of dislocations. The stress within the beam relaxes in the central part, then rises linearly to the free surfaces. This behaviour is quantitatively in agreement with critical thickness theory with a strain–thickness product for relaxation (plastic deformation) of 0.57 nm.
Keywords :
Thin films , Micromechanical modeling , Critical thickness theory , Dislocation dynamics , Bending test
Journal title :
ACTA Materialia
Serial Year :
2012
Journal title :
ACTA Materialia
Record number :
1146169
Link To Document :
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