• Title of article

    In situ observations of crack arrest and bridging by nanoscale twins in copper thin films Original Research Article

  • Author/Authors

    Seong-Woong Kim، نويسنده , , Xiaoyan Li، نويسنده , , Huajian Gao، نويسنده , , Sharvan Kumar، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2012
  • Pages
    14
  • From page
    2959
  • To page
    2972
  • Abstract
    In situ tensile experiments in a transmission electron microscope revealed that micro-cracks in ultrafine grained, free-standing, thin copper foils containing nanoscale twins initiated in matrix domains separated by the twins and then arrested at twin boundaries as twin boundary sliding proceeded. The adjacent microcracks eventually coalesced through shear failure of the bridging twins. To investigate the atomic mechanism of this rarely seen nanoscale crack bridging behavior, molecular dynamics simulations were performed to show that during crack propagation twin boundaries are impinged upon by numerous dislocations from the plastically deforming matrix. These dislocations react at the interface and evolve into substantially impenetrable dislocation walls that strongly confine crack nucleation and resist crack propagation, leading to the experimentally observed crack bridging behavior. The present results raise an approach to significantly toughening polycrystalline thin films by incorporating nanoscale twin structures into individual grains that serve as crack bridging ligaments.
  • Keywords
    In situ transmission electron microscopy , molecular dynamics , Nanoscale twins , Crack bridging , Dislocations
  • Journal title
    ACTA Materialia
  • Serial Year
    2012
  • Journal title
    ACTA Materialia
  • Record number

    1146293