Title of article
Silicon Σ13(5 0 1) grain boundary interface structure determined by bicrystal Bragg rod X-ray scattering Original Research Article
Author/Authors
P.B. Howes، نويسنده , , S. Rhead، نويسنده , , M. Roy، نويسنده , , C.L. Nicklin، نويسنده , , J.L. Rawle، نويسنده , , C.A. Norris، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2013
Pages
8
From page
5694
To page
5701
Abstract
The atomic structure of the silicon Σ13(5 0 1) symmetric tilt grain boundary interface has been determined using Bragg rod X-ray scattering. In contrast to conventional structural studies of grain boundary structure using transmission electron microscopy, this approach allows the non-destructive measurement of macroscopic samples. The interface was found to have a single structure that is fully fourfold coordinated. X-ray diffraction data were measured at Beamline I07 at the Diamond Light Source.
Keywords
Crystal truncation rod , Grain boundary , structure
Journal title
ACTA Materialia
Serial Year
2013
Journal title
ACTA Materialia
Record number
1147195
Link To Document