Title of article :
Electron microscopy analysis for crack propagation behavior of alumina
Author/Authors :
H. Matsuo، نويسنده , , M. Mitsuhara، نويسنده , , K. Ikeda، نويسنده , , S. Hata، نويسنده , , H. Nakashima، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
7
From page :
592
To page :
598
Abstract :
In order to clarify crack propagation behavior of alumina (α-Al2O3), intergranular and transgranular fractures of alumina were investigated by electron microscopy techniques. For the intergranular fractures cracked grain boundaries were investigated by scanning electron microscopic electron back-scattered diffraction (SEM-EBSD) analysis. It was revealed that the intergranular fracture behavior of polycrystalline alumina with random distribution of crystallographic orientations is independent on grain boundary characters. For the transgranular fractures, fracture surfaces formed in a single-crystalline alumina were observed by electron tomography combined with high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and high resolution TEM (HR-TEM). Three kinds of fracture surfaces were observed: even fracture surfaces, even fracture surfaces with step-terraces and fracture surfaces composed of the even fracture surface and the curved one. The even fracture surfaces mostly consist of cleavage planes parallel to image and image. On the other hand, the even fracture surfaces with step-terraces consist of the cleavage planes and basal planes (0 0 0 1). For the fracture surfaces composed of the even fracture surface and the curved one, both the even and curved shapes the even parts were formed by the fine cleavage planes and basal planes, whose intervals were inhomogeneous. It was indicated that the fracture surfaces in alumina are composed of the cleavage planes or basal plane at an atomic scale.
Keywords :
Scanning electron microscopic electron back-scattered diffraction (SEM-EBSD) , Electron tomography , High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) , High-resolution transmission electron microscopy (HR-T
Journal title :
INTERNATIONAL JOURNAL OF FATIGUE
Serial Year :
2010
Journal title :
INTERNATIONAL JOURNAL OF FATIGUE
Record number :
1162059
Link To Document :
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