Title of article :
Characterisation of phase relations and properties in air-oxidised Ti3SiC2
Author/Authors :
Low، I.M. نويسنده , , Wren، E. نويسنده , , Prince، K.E. نويسنده , , Atanacio، A. نويسنده ,
Pages :
-13
From page :
14
To page :
0
Abstract :
The oxidation of Ti3SiC2 in air from 25 to 1450 °C is characterised by differential thermal and gravimetric analysis (DTA/TGA), X-ray diffraction (XRD), grazing-incidence synchrotron radiation diffraction (GISRD), neutron diffraction (ND), transmission electron microscopy (TEM), secondary ions mass spectroscopy (SIMS) and Vickers indentation. The diffraction results show that rutile formed at a temperature of ~750 °C. A glassy phase - formed at >1000 °C - devitrified upon cooling to room temperature to form tridymite but crystallised to cristobalite at temperatures >= 1300 °C. Composition depth-profiling of the surface layer oxides by XRD, GISRD and SIMS revealed a graded distribution of phases (TiO2, SiO2 and Ti3SiC2) both at the nanoscale (=<1100 °C) and microscale level (>=1200 °C), which is particularly distinct at the interfaces. The oxide layers also exhibit a graded variation in microhardness.
Keywords :
Diffraction , SIMS , Ti3SiC2 , Oxidation , Depth-profiling
Journal title :
Astroparticle Physics
Record number :
116498
Link To Document :
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