Title of article
Dynamic response of Ag–Bi2223 tapes in applied fields by electric transport measurement Original Research Article
Author/Authors
Y.H. Zhang، نويسنده , , S.Y. Ding، نويسنده , , H. Luo، نويسنده , , X.F. Wu، نويسنده , , P. Zhang، نويسنده , , F.Y. Lin، نويسنده , , L. Qiu، نويسنده , , Z. Xu، نويسنده , , X.X. Yao، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
6
From page
29
To page
34
Abstract
Electric transport measurement of Ag-sheathed Bi2−xPbxSr2Ca2Cu3Oy tapes in magnetic fields H was conducted by the four-probe method to study the effect of H and sweeping rate of applied current dI/dt on critical current. It is found that H and dI/dt apparently affect the critical current and the V–I characteristic curve. To understand the experimental result, numerical simulation was carried out based on the collective creep model of the vortex glass. The numerical result is in agreement qualitatively with the experiment. It is shown that the influence of the applied field, temperature and vortex pinning on the normalized critical current can be reduced to a single critical current parameter n.
Keywords
V–I curves , Critical current , Ag–Bi2223 tapes , Critical current parameter n
Journal title
Cryogenics
Serial Year
2000
Journal title
Cryogenics
Record number
1171996
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