Title of article :
Experimental investigation of 3-W class-AB cryogenically-cooled amplifier employing GaN HEMT for front end receivers of mobile base stations Original Research Article
Author/Authors :
Y. Suzuki، نويسنده , , S. Narahashi، نويسنده , , T. Nojima، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Abstract :
This paper presents experimental results of a 2-GHz band gallium nitride high electron mobility transistor (GaN HEMT) amplifier cryogenically-cooled to 60 K as a part of the cryogenic receiver front end (CRFE) for mobile base station receivers. At a temperature of 60 K, the GaN HEMT amplifier attains the maximum power added efficiency of 62%, the saturation output power of 35 dBm, the gain of 26 dB, and the noise figure of 2.6 dB when operating at class-AB biasing. The results reported herein are the first on the performance of a cryogenically-cooled GaN HEMT amplifier aiming at use in a 2-GHz band CRFE.
Keywords :
Power applications (F) , RF applications (F) , Semiconductors (A)
Journal title :
Cryogenics
Journal title :
Cryogenics