Title of article :
MnO2 counter-electrode structure in Ta capacitors: A TEM study
Author/Authors :
Carvalho، P.A. نويسنده , , Dias، D. نويسنده , , Ferro، A.C. نويسنده , , Lohwasser، W. نويسنده ,
Pages :
-4722
From page :
4723
To page :
0
Abstract :
The structure of the MnO2 counter-electrode at the core of solid electrolytic tantalum capacitors has been investigated by transmission electron microscopy. The MnO2 layer presented well-crystallized grains with sizes between 100 and 200 nm. Extensive De Wolff disorder was observed within these crystallites. The structure has been identified by electron microdiffraction as randomly faulted pyrolusite, in which half ramsdellite slabs are generally isolated from each other, i.e., isolated double-chain layers are present in a single-chain matrix and no real intergrowth exists. De Wolff defects corresponding to two orientation variants can coexist in the same pyrolusite crystallite. No evidence for microtwinning on {0 1 1} or {0 3 1} planes has been found.
Keywords :
Electron diffraction , X-ray diffraction , Manganese dioxide , Crystalline oxides , TRANSMISSION ELECTRON MICROSCOPY
Journal title :
Astroparticle Physics
Record number :
117752
Link To Document :
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