Title of article :
Comparison between large area dc-magnetron sputtered and e-beam evaporated molybdenum as thin film electrical contacts
Author/Authors :
M.A. Mart?́nez، نويسنده , , J. C. Guillén and J. J. Ibarrola، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
Two different deposition techniques have been compared for obtaining large area Mo thin films as electrical back contacts in polycrystalline solar cells. The dc-magnetron sputtered layers have been made by varying dc-power (100–400 W), sputtering time (40–80 min) and Ar-mass flow rate (11–150 sccm) while e-beam evaporated Mo has been fabricated at several powers (1400–2000 W). Adequate optoelectronic, structural and morphological properties without stress have been achieved when intermediate Ar-mass flow rates are used during the sputtering process. Evaporated samples present higher electrical resistivity than sputtered ones but still valid for photovoltaic purposes. The 500–550 °C heat treatments in Se atmosphere modify Mo features by an appearing MoO2 layer on its surface.
Keywords :
Molybdenum , Optical reflectance , Sputtering , Roughness , Evaporation , X-ray diffraction
Journal title :
Journal of Materials Processing Technology
Journal title :
Journal of Materials Processing Technology