• Title of article

    Electro-chemical mechanical polishing of copper and chemical mechanical polishing of glass

  • Author/Authors

    V.C. Venkatesh، نويسنده , , S. Izman، نويسنده , , S.C. Mahadevan، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2004
  • Pages
    6
  • From page
    493
  • To page
    498
  • Abstract
    In IC and optical manufacturing some of the materials that are polished after grinding are Si, Ge, Pyrex and BK 7 glass. In the case of Al, Cu and W, they are deposited and are CMP polished. The polishing process used on IC wafers is chemical mechanical polishing (CMP) that has in built facilities for planarizing as well. There are two major applications in ultralarge scale integrated circuits (ULSI) manufacturing. One application is to smooth surface topography of interlevel dielectric (ILD), e.g. doped oxide or silicon oxide and another application is to remove excess Cu material to produce inlaid metal structures or isolation trenches. Cu CMP is employed for Cu metallization on oxide layers, which are patterned and etched to form vias, and trenches that are subsequently electroplated to fill with copper. Recent publications indicate evidence of copper undergoing electro-chemical mechanical interactions during polishing.
  • Keywords
    Chemical mechanical polishing , Ultralarge scale integrated circuits , Interlevel dielectric
  • Journal title
    Journal of Materials Processing Technology
  • Serial Year
    2004
  • Journal title
    Journal of Materials Processing Technology
  • Record number

    1178457