• Title of article

    Dynamic reliability via computational solution of generalized state-transition equations for entry-time processes

  • Author/Authors

    Paul Nelson، نويسنده , , Shuwen Wang، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2007
  • Pages
    13
  • From page
    1281
  • To page
    1293
  • Abstract
    Entry-time processes are finite-state continuous-time jump processes with transition rates depending only on the two states involved, the calendar time, and the most recent arrival time (entry time). Entry-time processes are transformed into Markov processes via the standard technique of incorporating entry time into the state variables. It is shown that the associated state-transition (Chapman–Kolmogorov) equations can be written as a coupled pair of integrodifferential equations. A finite-difference approximation to these equations is developed. This computational approach is verified, and some of its properties delineated, via two hypothetical examples. One of these examples admits a semi-analytic solution, while simulations provide the base of comparison for the other.
  • Keywords
    Dynamic reliability , Entry-time process , Chapman–Kolmogorov equations , Semi-Markov processes , Computational solution , State model
  • Journal title
    Reliability Engineering and System Safety
  • Serial Year
    2007
  • Journal title
    Reliability Engineering and System Safety
  • Record number

    1187677