Cost-effective degradation test plan for a nonlinear random-coefficients model

The determination of requisite sample size and the inspection schedule considering both testing cost and accuracy has been an important issue in the degradation test. This paper proposes a cost-effective degradation test plan in the context of a nonlinear random-coefficients model, while meeting some precision constraints for failure-time distribution. We introduce a precision measure to quantify the information losses incurred by reducing testing resources. The precision measure is incorporated into time-varying cost functions to reflect real circumstances. We apply a hybrid genetic algorithm to general cost optimization problem with reasonable constraints on the level of testing precision in order to determine a cost-effective inspection scheme. The proposed method is applied to the degradation data of plasma display panels (PDPs) following a bi-exponential degradation model. Finally, sensitivity analysis via simulation is provided to evaluate the robustness of the proposed degradation test plan.