Combinatorial thin film sputtering investigation of cerium concentration in Lu2SiO5 scintillators

Lutetium oxyorthosilicate (LSO) thin films with a cerium thickness gradient were sputter deposited to investigate the optimum cerium concentration for emission intensity. Thin film cerium concentration ranged from 0.06 to 0.88 at%. To compare the thin film samples to single crystal LSO, a set of single crystal LSO samples were investigated with cerium concentrations of 0.0015, 0.0095 and 0.078 at%. The thin film samples showed peak photoluminescence emission intensity at a cerium concentration of 0.35 at%; however, the single crystal samples exhibited peak photoluminescence emission intensity at a lower cerium concentration of 0.0095 at%. The photoluminescence excitation and emission spectra as a function of concentration demonstrate the concentration quenching behavior and the mechanisms are speculated to be due to radiative (self-absorption) and non-radiative energy transfer, which may be phonon assisted.