Title of article :
Estimation of the acceleration ability for electrons in SiO2 and the tunneling effect
Author/Authors :
Fujun Zhang، نويسنده , , Zheng Xu، نويسنده , , Feng Teng، نويسنده , , Shengyi Yang، نويسنده , , Zhidong Lou، نويسنده , , Ling Liu، نويسنده , , Lijian Meng، نويسنده , , Yanbing Hou، نويسنده , , Yongsheng Wang، نويسنده , , Xurong Xu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
5
From page :
90
To page :
94
Abstract :
Silicon dioxide (SiO2) plays an important role in layered optimization scheme and solid-state cathodoluminescence (SSCL). Initially, it was believed that the SiO2 layer would (i) generate extra interface states contributing to a number of primary electrons available for exciting the luminescent centers, and/or (ii) act as acceleration layer resulted in gaining high energy for those electrons that would tunnel into the luminescent layer to excite luminescent centers. Based on the brightness vs. voltage (B–V) measurements, we deem that the latter case, i.e. acceleration and tunneling, is the dominant mechanism. A detailed discussion in terms of electrons acceleration and tunneling as the main contributions to the enhancement of brightness is presented.
Keywords :
electron acceleration , Inorganic electroluminescence (IEL) , Tunneling effect
Journal title :
Journal of Luminescence
Serial Year :
2006
Journal title :
Journal of Luminescence
Record number :
1260957
Link To Document :
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