Correlation between structural changes and luminescent properties of ZnMgS:Mn thin film phosphor with annealing temperature

With varying rapid thermal annealing temperature, luminescent properties of image:Mn thin film deposited by RF-magnetron sputtering technique were investigated. Although all samples were deposited from identical source composition, it was found that a main peak wavelength of photoluminescence of image:Mn depended on RTA temperatures and it shifted toward shorter wavelength upon the increase of RTA temperature. The same dependence of wavelength on RTA temperature was also observed in cathodoluminescence as well as electroluminescence measurements. It is noticeable that image:Mn thin film phosphor in this study showed more reddish emission than those of the previous studies.