Title of article :
Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data
Author/Authors :
Yong-Il Kim، نويسنده , ,
Seung-Hoon Nahm، نويسنده , , WON BIN IM، نويسنده , , DUK YOUNG JEON، نويسنده , , Duncan H. Gregory، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Abstract :
Blue-color emitting material, CaMgSi2O6:Eu2+ (CMS:Eu2+), was synthesized by a normal solid state reaction using CaCO3, MgO, SiO2 and EuF3 as starting materials. The Rietveld method was employed to quantitatively determine the structural parameters of synthesized CMS:Eu2+. The structural parameters for CMS:Eu2+ were successfully determined by Rietveld refinement using X-ray powder diffraction data. The final weighted R-factor, Rwp, was 9.22% and the goodness-of-fit indicator, image, was 1.45. The synthesized sample consisted of CMS:Eu2+ and SiO2 (cristobalite) phases with refined phase fractions of 89.18(1)% and 10.82(2)%, respectively. Doped Eu2+ ions occupied the Ca sites (4e) and replaced 1.0% of the Ca2+ ions. The refined model of CMS:Eu2+ describes a structure in monoclinic space group C 2/c with image, image(2) Å, image(2) Å, image(1) Å and image (1)°.
Keywords :
Photoluminescence , X-ray crystallography , Plasma display panel , Blue emission
Journal title :
Journal of Luminescence
Journal title :
Journal of Luminescence