• Title of article

    Luminescence behavior and compensation effect of N-doped ZnO films deposited by rf magnetron sputtering under various gas-flow ratios of O2/N2

  • Author/Authors

    Wei-Min Cho، نويسنده , , Yow-Jon Lin، نويسنده , , Chia-Jyi Liu، نويسنده , , Liang-Ru Chen، نويسنده , , Yu-Tai Shih، نويسنده , , Perry Chen، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2014
  • Pages
    4
  • From page
    884
  • To page
    887
  • Abstract
    The photoluminescent and electrical properties of N-doped ZnO films fabricated by rf magnetron sputtering under various gas-flow ratios of O2/N2 were examined in this study. The dependence of conduction type on the gas-flow rate of O2/N2 was found. The authors identified a direct correlation between the defect spectral feature and conduction type of N-doped ZnO samples and provided a physical model for producing p-type ZnO. According to these observed results, the authors suggested that p-type conversion of N-doped ZnO may be due to a combined effect of the increased acceptor (substitutional nitrogen in oxygen site, zinc vacancy and interstitial oxygen) density and the decreased donor (oxygen vacancy) density. In addition, synthesis of p-type N-doped ZnO was repeated, suggesting that p-type ZnO can be fabricated with excellent reproducibility by rf magnetron sputtering a ZnO target doped with nitrogen.
  • Keywords
    DEFECT , Conductivity , Raman scattering , Photoluminescence , ZNO
  • Journal title
    Journal of Luminescence
  • Serial Year
    2014
  • Journal title
    Journal of Luminescence
  • Record number

    1263481