Title of article
Soft ESD phenomena in GMR heads in the HDD manufacturing process ☆
Author/Authors
Yoshiaki Mizoha، نويسنده , , Taro Nakanoa، نويسنده , , Kozo Tagashiraa، نويسنده , , Kazuo Nakamuraa، نويسنده , , Tatsuya Suzukib، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
8
From page
72
To page
79
Abstract
GMR (giant magnetoresistive) heads used for HDD (hard disk drives) are very sensitive to ESD (electrostatic discharge). Some kinds of ESD damages will cause soft magnetic degradations of head performance with a progressive nature. We report examples of head degradations by ESD damages as well as other damages due to head scratches, electro-migration effects and corrosion of GMR stack. It is usually very difficult to distinguish these phenomena explicitly by QST (quasistatic tester) and spinstand measurement test. We show that head scratches can cause damages similar to damages caused by ESD and that re-magnetization has certain potential to correct the damaged magnetic structure caused by such scratches.
Keywords
EDS , GMRheads , HDDmanufacturing
Journal title
JOURNAL OF ELECTROSTATICS
Serial Year
2006
Journal title
JOURNAL OF ELECTROSTATICS
Record number
1264749
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