Title of article
A study of relation between a power supply ESD and parasitic capacitance ☆
Author/Authors
Teruo Suzukia، نويسنده , , Junji Iwahoria، نويسنده , , Teruo Moritaa، نويسنده , , Haruyoshi Takaokaa، نويسنده , , Toshio Nomurab، نويسنده , , Kenji Hashimotoc، نويسنده , , Shoji Ichinoc، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
8
From page
760
To page
767
Abstract
In this study, we show that increased parasitic capacitance across lateral NPN (LNPN) devices does not necessarily enhance the electro-static discharge (ESD) robustness. Since the drain-bulk displacement current decreases, the LNPN avalanche trigger current increases and the PN junctions fail early. In our case, this happened when the parasitic capacitance between supply lines is around several hundreds of Pico-Farads.
Keywords
Electro-staticdischarge , Parasiticcapacitance
Journal title
JOURNAL OF ELECTROSTATICS
Serial Year
2006
Journal title
JOURNAL OF ELECTROSTATICS
Record number
1264836
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