A low-voltage decay time analyzer for monitoring ionizers

This paper presents a development of a low-voltage decay time analyzer to replace the charged plate monitor which works at the high-voltage level. The proposed low-voltage decay time analyzer is based on the measurement of the induced charges on a conductive plate via an ultra-high input impedance amplifier. A microcontroller with an Ethernet module is the central processing to control, calculate the decay time, and enable network communications. The test results show that the analyzed decay times correlate to the standard test method.