Title of article
Bonding behavior of copper thick films containing lead-free glass frit on aluminum nitride substrates
Author/Authors
Xinrui Xu، نويسنده , , Hanrui Zhuang، نويسنده , , Wenlan Li، نويسنده , , Guojian Jiang، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
5
From page
661
To page
665
Abstract
The present work indicates through thermodynamic considerations that the calcium, barium-borosilicate glass, which was selected as the bonding agent in copper paste, is chemically compatible to aluminum nitride (AlN) substrate. Meanwhile it implicates the scarce of reactivity which results in poor adhesion strength between the copper thick film and the AlN substrate. However after pre-oxidized treatment on AlN substrate, the adhesion strength was improved significantly by about 1 kg/mm2 (at 20 vol.% glass frit) than that of the untreated AlN substrate, due to the improved reactivity of the glass frit. The adhesion strength is also demonstrated being affected by frit content and firing temperature. The optimum value (1.85 kg/mm2) was obtained when the copper paste (containing 20 vol.% glass frit) was printed on the pre-oxidized AlN substrate and subsequently fired at 850 °C.
Keywords
E. Substrates , adhesion strength , Aluminum nitride , Copper thick films
Journal title
Ceramics International
Serial Year
2004
Journal title
Ceramics International
Record number
1268751
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