Title of article :
Enhanced ferroelectric properties of 0.95Pb(Sc0.5Ta0.5)O3–0.05PbTiO3 thin films with Pb(Zr0.52,Ti0.48)O3 seed layer
Author/Authors :
Yunti Pu، نويسنده , , Jiliang Zhu، نويسنده , , Xiaohong Zhu، نويسنده , , Yuansheng Luo، نويسنده , , Xuedong Li، نويسنده , , Mingsong Wang، نويسنده , , Jing Liu، نويسنده , , Xuhai Li، نويسنده , , Jianguo Zhu، نويسنده , , Dingquan Xiao، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Pages :
4
From page :
233
To page :
236
Abstract :
0.95Pb(Sc0.5Ta0.5)O3–0.05%PbTiO3 (PSTT5) thin films with and without a Pb(Zr0.52,Ti0.48)O3 (PZT52/48) seed layer were deposited on Pt/Ti/SiO2/Si(1 0 0) substrates by RF magnetron sputtering. X-ray diffraction patterns indicate that the PSTT5 film with a PZT52/48 seed layer exhibited nearly pure perovskite crystalline phase with highly (4 0 0)-preferred orientation. Piezoresponse force microscopy observations reveal that a large out-of-plane spontaneous polarization exists in the highly (4 0 0)-oriented PSTT5 thin film. The PSTT5/PZT(52/48) possesses good ferroelectric properties with large remnant polarization Pr (12 μC/cm2) and low coercive field Ec (110 kV/cm). Moreover, The perfect butterfly-shaped capacitance–voltage characteristic curve and the relative dielectric constant as high as 733 is obtained in this PSTT5 thin film at 100 kHz.
Keywords :
PSTT film , PZT seed layer , C. Dielectric properties , C. Ferroelectric properties
Journal title :
Ceramics International
Serial Year :
2012
Journal title :
Ceramics International
Record number :
1273700
Link To Document :
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