Preparation and characterization of LixZn2−xVxSi1−xO4 ceramics

In this work, LixZn2−xVxSi1−xO4 (x=0.9, 0.8, 0.7, 0.5, 0.3, 0.2, and 0.1) ceramics were obtained by the conventional solid-state reaction method, using a different sintering temperatures for each x. We report on the compositional and morphological characterization of LixZn2−xVxSi1−xO4 samples, as well as on the influence of the composition on the photoluminescence and dielectric properties. The highest emission intensity was attained for x=0.9, while the best microwave dielectric properties (εr~7.8 and Qf~21,122 GHz) were achieved for x=0.8.