Title of article :
Avoidance of stiction in the release of highly boron doped micro-actuators fabricated using BESOI substrates
Author/Authors :
Rosa، M.A. نويسنده , , Dimitrijev، S. نويسنده , , Harrison، H.B. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
This paper presents a new technique which has been successfully applied to the fabrication of micromachined components to avoid the ʹdevice stictionʹ often encountered during the final processing steps of micro-fabrication. Based on the use of BESOI substrates, this technique involves the heavy boron doping of the final processed structure, followed by a timed wet etch which releases the micromachined device by controllably lowering the undoped Si substrate beneath it.
Keywords :
Thermal benchmark IC , Dynamic thermal modeling of IC packages , Measuring of thermal coupling in ICs
Journal title :
MICROELECTRONICS RELIABILITY
Journal title :
MICROELECTRONICS RELIABILITY