• Title of article

    MOCVD of ferroelectric thin films

  • Author/Authors

    Schmidt، C. نويسنده , , Burte، E.P. نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    -256
  • From page
    257
  • To page
    0
  • Abstract
    A low-pressure chemical vapor deposition system for growing ferroelectric thin PZT films has been developed. It consists of a dispensing and vaporizing system for up to four liquid metal precursors and a cold wall reactor, where the reactions are carried out at pressures below I Torr and at temperatures between 330 and 500°C. The thickness of the deposited films ranged from 10 nm to 1 (mo)m. The investigated films in this report are lead-titanate, PbTiO3 and lead-zirconate-titanate, Pb(Zr,Ti)O3.
  • Keywords
    Thermal benchmark IC , Dynamic thermal modeling of IC packages , Measuring of thermal coupling in ICs
  • Journal title
    MICROELECTRONICS RELIABILITY
  • Serial Year
    1999
  • Journal title
    MICROELECTRONICS RELIABILITY
  • Record number

    12888