Title of article
A model of l/f noise spectrum generation in granular structures
Author/Authors
Takagi، Keiji نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
-540
From page
541
To page
0
Abstract
A fluctuating spectrum was calculated and a Lorentzian type spectrum obtained, in a contacting spot between the tapered grain boundaries and l/f type spectrum on the granular structure in low frequency. This is based on the spontaneous temperature fluctuation of the small conducting spots between the grains and thermal conduction in the granular structures. © 1999 Elsevier Science Ltd. All rights reserved.
Keywords
Microstructural analysis , Electromigration , Aluminum alloys , Resistance measurements
Journal title
MICROELECTRONICS RELIABILITY
Serial Year
1999
Journal title
MICROELECTRONICS RELIABILITY
Record number
12954
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