X-ray photoelectron spectroscopic studies of electrodeposited mercury cadmium telluride semiconductor thin films Original Research Article

Mercury cadmium telluride (MCT) polycrystalline thin films were grown by electrodeposition technique, at varying conditions. The X-ray photoelectron spectroscopic (XPS) studies have been carried out on MCT thin films to analyze the quality and nature of the films. The various elements present and the surface contamination in electrodeposited MCT films were identified. The chemical states of the various elements present were studied and their quantification was also carried out. The deposition conditions were identified for growing the MCT films of specific compositions.