Title of article :
Microstructural and optical properties of strain compensated InxGa1−xAs/InyAl1−yAs multiple quantum wells Original Research Article
Author/Authors :
T.W. Kim، نويسنده , , D.U. Lee، نويسنده , , D.C Choo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
5
From page :
89
To page :
93
Abstract :
Transmission electron microscopy (TEM) and photocurrent (PC) measurements were carried out to investigate the microstructural and excitonic transitions in In0.52Ga0.48As/In0.55Al0.45As multiple quantum wells (MQWs). TEM images showed that high-quality 11-period strain-compensated In0.52Ga0.48As/In0.55Al0.45As MQWs had high-quality heterointerfaces. Based on the TEM results, a possible crystal structure for the In0.52Ga0.48As/In0.55Al0.45As MQWs is presented, and their strains are compensated. The results for the PC data at 300 K for several applied electric fields showed that several excitonic transitions shifted to longer wavelengths as the applied electric field increased. These results indicate that the strain-compensated In0.52Ga0.48As/In0.55Al0.45As MQWs hold promise for electroabsorption modulator devices.
Keywords :
A. Quantum wells , B. Epitaxial growth , D. Optical properties
Journal title :
Journal of Physics and Chemistry of Solids
Serial Year :
2002
Journal title :
Journal of Physics and Chemistry of Solids
Record number :
1307749
Link To Document :
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