Surface segregation in yttria-stabilized zirconia by means of angle resolved X-ray photoelectron spectroscopy Original Research Article

Surface segregation of cations in undoped and titanium-doped yttria-stabilized zirconia was studied in air in the temperature range from 800 to 1400°C. Surface composition and distribution of the elements across the surface layer was examined using angle resolved X-ray photoelectron spectroscopy. The annealing procedure induced a silicon-rich surface layer of low zirconium concentration. The yttrium concentration only slightly increased at the surface. Enrichment factor of titanium in the titanium-doped yttria-stabilized zirconia was found to be higher than that of yttrium. No significant correlation between segregation of other cations was found.