Title of article :
Substrate dependent properties of electrodeposited EuTe thin films Original Research Article
Author/Authors :
N.S. Gaikwad، نويسنده , , V.M. Nikale، نويسنده , , C.H. Bhosale *، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
8
From page :
723
To page :
730
Abstract :
In electrodeposition, substrate besides providing mechanical support to the electrodeposit, affects significantly the structural and morphological properties of a film. Electrodeposition and characterization of EuTe thin films onto different substrates such as stainless steel (SS), titanium (Ti), copper (Cu), fluorine-doped tin oxide (F:SnO2) covered glasses have been described. The deposition potentials have been estimated from the polarization curves. The reaction mechanism is proposed for the formation of EuTe electrodeposits. Preparative parameters such as deposition potential, current density, and deposition time are studied. The films have been characterized by X-ray diffraction, scanning electron microscopy (SEM), atomic force microscopy (AFM) and energy dispersive analysis by X-rays (EDAX) techniques. The electrodeposited EuTe films are polycrystalline on all the substrates with same cubic crystal structure. The SEM studies reveal that the surface morphology is different for the substrates studied. However, no cracks have been observed in the SEM micrographs. The AFM images show large spherical grains supporting the polycrystalline nature of the samples. The EDAX analysis shows that the EuTe films are nearly stoichiometric, slightly rich in tellurium.
Keywords :
Elecrodeposition , Europium telluride , A. Thin films , Scanning electron microscopy , C. X-ray diffraction
Journal title :
Journal of Physics and Chemistry of Solids
Serial Year :
2003
Journal title :
Journal of Physics and Chemistry of Solids
Record number :
1308220
Link To Document :
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