Title of article :
Electrical conduction in ordered defect compounds Original Research Article
Author/Authors :
S.M. Wasim، نويسنده , , C. Rinc?n، نويسنده , , G. Mar??n، نويسنده , , R. M?rquez، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
6
From page :
1627
To page :
1632
Abstract :
A comparative study of the temperature dependence of electrical resistivity, carrier concentration and carrier mobility of the Ordered Defect Compounds (ODCs) CuIn3Se5, CuIn3Te5, and CuIn5Te8 with their corresponding normal 1:1:2 phase is reported. Relatively lower carrier concentration and higher activation energy observed in ODCs is explained on the basis that shallow acceptor or donor levels observed in 1:1:2 phase are partially annihilated in these compounds due to attractive interaction between VCu−1 and InCu+2 defect pair. In the activation regime, the mobility is explained by taking into account a scattering mechanism of the charge carriers with donor–acceptor defect pairs. The electrical data at lower temperatures is explained with the existing theoretical expression for the nearest neighbor hopping conduction mechanism.
Keywords :
A. Semiconductors , A. Electronic materials , D. Electrical properties , D. Transport properties , D. Defects
Journal title :
Journal of Physics and Chemistry of Solids
Serial Year :
2003
Journal title :
Journal of Physics and Chemistry of Solids
Record number :
1308342
Link To Document :
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