Title of article
Deposition of CuInS2 thin films by RF reactive sputtering with a ZnO:Al buffer layer Original Research Article
Author/Authors
A.M. Serventi، نويسنده , , R. Dolbec، نويسنده , , M.A.El Khakani، نويسنده , , R.G. Saint-Jacques، نويسنده , , D.G. Rickerby، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
5
From page
2075
To page
2079
Abstract
As a preliminary step towards superstrate-type solar cells, we fabricated films of a CuInS2/ZnO:Al/float glass configuration. A layer of aluminum doped ZnO (ZnO:Al) with a thickness of 320–450 nm was first prepared on float glass at 200 °C by mid-frequency magnetron reactive sputtering. Then, a CuInS2 layer, typically 500 nm thick, was deposited on this buffer at 200 °C by radio frequency reactive sputtering. X-ray diffraction revealed that the as-sputtered CuInS2 films are of chalcopyrite crystalline phase with a highly (112) preferential orientation. The surface morphology and microstructure of the films were characterized by atomic force microscopy and scanning electron microscopy, respectively. The as-sputtered layers are typically very homogeneous in depth as examined by secondary ion mass spectrometry. After anneal at 500 °C for 2 h, the sputtered CuInS2 films feature a sharp fundamental absorption edge at 1.49 eV, which is suitable for absorbing sunlight from the solar spectrum.
Keywords
A. Thin films
Journal title
Journal of Physics and Chemistry of Solids
Serial Year
2003
Journal title
Journal of Physics and Chemistry of Solids
Record number
1308427
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