Title of article :
Evaluation of P-HEMT MMIC technology PH25 for space applications
Author/Authors :
Huguet، P. نويسنده , , Auxemery، P. نويسنده , , Pataut، G. نويسنده , , Garat، F. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
The evaluation of the P-HEMT technology PH25 according to the European Space Agency requirements is presented. The reliability assessment plan features high temperature storage tests, DC life-tests and RF life-tests, performed on a set of evaluation test vehicles specifically defined for this purpose. The results of these tests evidence a temperature activated wear-out mechanism, a very low sensitivity of PH25 on strong RF stress and no sensitivity on hydrogen. Failure rates calculations are in line with the space programme requirements. © 1999 Elsevier Science Ltd, All rights reserved.
Keywords :
Electromigration , Resistance measurements , Aluminum alloys , Microstructural analysis
Journal title :
MICROELECTRONICS RELIABILITY
Journal title :
MICROELECTRONICS RELIABILITY