A Cauchois-type X-ray spectrometer for momentum density studies on heavy-element materials Original Research Article

This article describes the new spectrometer setup for high-resolution Compton scattering experiments at BL08W, SPring-8. It employs an X-ray image intensifier (X-II) system as a position sensitive detector (PSD). The installation of the X-II system has improved the data-acquisition efficiency by 20 times compared to the previous quasi-PSD system. Compton profiles of CeRh3B2 have been measured with sufficient statistical accuracy, which indicates that the new setup can measure Compton profiles of virtually all materials within a reasonable beamtime.