Title of article :
A simpler method for life-testing laser diodes
Author/Authors :
M.Vanzi، نويسنده , , A.Bonfiglio، نويسنده , , Salmini، G. نويسنده , , Palo، R. De نويسنده , , G.Martines، نويسنده , , M.Licheri، نويسنده , , R.DArco، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
The procedure of measuring the I(V) characteristics of laser diodes at fixed time steps of a constant current life-test is revised. The possibility of using the test equipment itself to extract the characteristics is investigated and demonstrated. This eliminates the most troublesome manual procedure in life-testing several devices. ©1999 Elsevier Science Ltd. All rights reserved.
Keywords :
Aluminum alloys , Resistance measurements , Electromigration , Microstructural analysis
Journal title :
MICROELECTRONICS RELIABILITY
Journal title :
MICROELECTRONICS RELIABILITY
