Title of article
Development of X-eX spectrometer at KEK-PF-AR Original Research Article
Author/Authors
H. Uchiyama، نويسنده , , H. Adachi and W. Drube، نويسنده , , S. Kishimoto ، نويسنده , , M. Itou، نويسنده , , H. Sakurai، نويسنده , , F. Itoh، نويسنده , , H. Kawata، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
4
From page
2216
To page
2219
Abstract
An X-eX spectrometer has been developed to obtain the two-dimensional and three-dimensional electron momentum density (2D- and 3D-EMD) directly from experiment. The spectrometer is equipped with a time-of-flight energy analyzer to record the flight direction and the kinetic energies of the recoiled electrons, and a position sensitive photon detector to record the directions of the Compton scattered photons. The signals from the electron branch and those from the photon branch are processed in coincidence mode. The obtained 2D-EMD on the (100) plane in Si and the 3D-EMD on the [100] and the [111] axes are compared with the FLAPW theoretical results.
Journal title
Journal of Physics and Chemistry of Solids
Serial Year
2005
Journal title
Journal of Physics and Chemistry of Solids
Record number
1309219
Link To Document