Author/Authors :
C. Sternemann، نويسنده , , J.A. Soininen، نويسنده , , M. Volmer، نويسنده , , A. Hohl، نويسنده , , G. Vanko، نويسنده , , S. Streit، نويسنده , , James M. Tolan، نويسنده ,
Abstract :
X-ray Raman spectra of bulk amorphous SiO have been measured at energy losses around the Si LII,III-edges for different momentum transfers at beamline ID16 of ESRF. The spectra are compared with measurements of the LII,III-edges of Si powder and with results of first-principles calculations for Si and α-quartz SiO2. Indications of sub-oxidic contributions to the LII,III-edges are found in the experiment and discussed with respect to the model of interface clusters mixture in bulk amorphous SiO.
