Electron beam induced current imaging of dislocations in Cd0.9Zn0.1Te crystal Original Research Article

Electron beam induced current (EBIC) imaging of semi-insulating nuclear radiation detector grade cadmium zinc telluride (CZT) crystal is reported in this paper. The correlation of the EBIC results with the results of defect delineating chemical etching suggests that the irregular shaped pattern in the EBIC image is due to agglomerates of dislocations in CZT crystal.