Title of article
Electron beam induced current imaging of dislocations in Cd0.9Zn0.1Te crystal Original Research Article
Author/Authors
Ramesh M. Krishna، نويسنده , , Peter G. Muzykov، نويسنده , , Krishna C. Mandal، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2013
Pages
4
From page
170
To page
173
Abstract
Electron beam induced current (EBIC) imaging of semi-insulating nuclear radiation detector grade cadmium zinc telluride (CZT) crystal is reported in this paper. The correlation of the EBIC results with the results of defect delineating chemical etching suggests that the irregular shaped pattern in the EBIC image is due to agglomerates of dislocations in CZT crystal.
Keywords
A. Semiconductor , D. Defects
Journal title
Journal of Physics and Chemistry of Solids
Serial Year
2013
Journal title
Journal of Physics and Chemistry of Solids
Record number
1311821
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