Title of article
Relaxation of operational amplifier parameters after pulsed electron beam irradiation
Author/Authors
Betty، C.A. نويسنده , , Girija، K.G. نويسنده , , Lal، R. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
-1484
From page
1485
To page
0
Abstract
An approach to modify a given scheduled data flow graph (SDFG) for improving on-line testability olʹ a data path is presented. Each functional unit (FU) of a data path is tested at least once in a time frame called pass. The approach utilizes idle-time of FUs. A given SDFG is utilized to estimate the number of FUs and their idle periods in which certain operations, called idle-time operations, are scheduled. Modified SDFG is utilized by OLI].- FLJ allocation technique presented earlier that minimizes the testing time. Addition of idle-time operations improves the testability without affecting FUsʹ count. The technique yields promising results. (C) 1999 Elsevier Science Ltd. All rights reserved.
Keywords
LINAC , Time dependent phenomena , Operational amplifiers , Relaxation , Pulsed irradiation
Journal title
MICROELECTRONICS RELIABILITY
Serial Year
1999
Journal title
MICROELECTRONICS RELIABILITY
Record number
13180
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