Title of article
Variation of lattice dimensions in epitaxial SnS films on MgO(001)
Author/Authors
Hiroshi Nozaki، نويسنده , , Mitsuko Onoda، نويسنده , , Masamitsu Sekita، نويسنده , , Kousuke Kosuda، نويسنده , , Toshiaki Wada، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
8
From page
245
To page
252
Abstract
Epitaxial and polycrystalline SnS films were prepared on MgO(001) and glass substrates using molecular beam epitaxy. The films were characterized by X-ray diffraction method. The orientations of epitaxial films were (010)[100]SnS||(001)[100]MgO or (010)[001]SnS||(001)[100]MgO. Lattice parameters of the polycrystalline film closely resembled those of bulk SnS at room temperature. However, the lattice parameters of epitaxial films varied widely and were very different from those of bulk SnS at room temperature. Considering the lattice dimensions and image ratio, the films roughly correspond to bulk SnS at elevated temperatures from 371 to 666 K. SEM images of the films showed needle- or circular-like SnS crystallites segregated from the epitaxial films. Respective energies of indirect band gaps of the films and refractive index of the polycrystalline film were estimated using results of optical transmission experiments.
Keywords
Tin sulfide , Epitaxial films , Molecular beam epitaxy , X-ray diffraction , Lattice parameters , SEM image , Segregation , Band gap , Refractive index , Magnesium oxide
Journal title
JOURNAL OF SOLID STATE CHEMISTRY
Serial Year
2005
Journal title
JOURNAL OF SOLID STATE CHEMISTRY
Record number
1330225
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