• Title of article

    Copper position in type-I Ba8Cu4Si42 clathrate

  • Author/Authors

    L. Yang، نويسنده , , Y. Wang، نويسنده , , T. Liu، نويسنده , , T.D. Hu، نويسنده , , B.X. Li، نويسنده , , Heinz K. Stahl، نويسنده , , S.Y. Chen، نويسنده , , M.Y. Li، نويسنده , , P. Shen، نويسنده , , G.L Lu، نويسنده , , Y.W. Wang، نويسنده , , J.Z. Jiang، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    5
  • From page
    1773
  • To page
    1777
  • Abstract
    Local structure of Cu in a type-I Ba8Cu4Si42 clathrate has been investigated by synchrotron X-ray powder diffraction, Cu K-edge extended X-ray absorption fine spectroscopy, X-ray absorption near edge spectroscopy (XANES) and theoretical calculation. It is found that XANES spectra cannot be explained by the substitution of Cu atoms at Si16i, and Si24k positions. Our calculations show that the binding energies of the Si atom in Si16i, Si24k and Si6c positions are 9.000, 9.495 and 8.911 eV, respectively. Both experimental and theoretical results support that Cu atoms in the type-I Ba8Cu4Si42 clathrate, as a doped element, prefer to occupy the least-binding Si, i.e., the Si6c sites. No structural change between 112 and 300 K was observed and the (100)-faceted cubic crystal has negligible distortion/ordering according to transmission electron microscopy.
  • Keywords
    Synchrotron radiation , EXAFS , Silicides , Semiconductor , FP-LMTO
  • Journal title
    JOURNAL OF SOLID STATE CHEMISTRY
  • Serial Year
    2005
  • Journal title
    JOURNAL OF SOLID STATE CHEMISTRY
  • Record number

    1330421