Deuterium retention and lattice damage in tungsten irradiated with D ions

Depth profiles of D atoms and D2 molecules in a W single crystal implanted with 6 keV D ions at 300 K have been determined using secondary ion mass spectrometry (SIMS) and residual gas analysis (RGA) measurements in the course of surface sputtering. Profiles of deuterium and lattice damage in a W single crystal irradiated with 10 keV D ions at 300 K have been investigated by means of nuclear reaction analysis (NRA) and Rutherford backscattering spectrometry combined with ion channelling techniques (RBS/C). There are at least two types of ion-induced defects which are responsible for trapping of deuterium: (i) D2-filled microvoids (deuterium bubbles) localised in the implantation zone; and (ii) dislocations which are distributed from the surface to depths far beyond 1 μm and which capture deuterium in the form of D atoms.