Title of article
Onion-skin method (OSM) analysis of DIII-D edge measurements
Author/Authors
Stangeby، نويسنده , , P.C. and Watkins، نويسنده , , J.G. and Porter، نويسنده , , G.D. and Elder، نويسنده , , J.D. and Lisgo، نويسنده , , S. and Reiter، نويسنده , , D. and West، نويسنده , , W.P. and Whyte، نويسنده , , D.G.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
5
From page
733
To page
737
Abstract
OSM analysis provides, in principle a method for establishing the 2-D edge `fieldsʹ of ne, Te, Ti, etc., which is the prerequisite for analyzing the physics processes occurring in the edge, including impurity behavior. In order to further test this method, an OSM analysis of an extensive edge database for an L-mode DIII-D discharge has been carried out, the first part of which is reported here. Consistency of the OSM results with Langmuir probe, Dα, and edge Thomson scattering measurements encourages further development of the method.
Keywords
SOL plasma , Divertor plasma , DIII-D , 2D model , Fluid simulation , OSM model
Journal title
Journal of Nuclear Materials
Serial Year
2001
Journal title
Journal of Nuclear Materials
Record number
1348895
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