Title of article :
Chemical diffusion in uranium dioxide – influence of defect interactions
Author/Authors :
Ruello، نويسنده , , P and Chirlesan، نويسنده , , G and Petot-Ervas، نويسنده , , G and Petot، نويسنده , , C and Desgranges، نويسنده , , L، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
8
From page :
202
To page :
209
Abstract :
The chemical diffusion coefficient of UO2+x was determined from electrical conductivity measurements performed during transient state, for departure from stoichiometry in the range 0<x<0.17 and for temperatures varying from 973 to 1673 K. It was found that D is a decreasing function of the departure from stoichiometry, while the oxygen diffusion coefficient reported in literature is an increasing function in the same range of departure from stoichiometry. For x<0.07, this behavior was attributed to the presence of the singly ionized (2:2:2)′ Willis defects evidenced by electrical conductivity measurements. The enthalpy of formation of these clusters amounts to ΔHf=−1.7±0.6 eV. For x⩾0.07, the decreasing function of D with x can be explained either by Willis defects α time ionized or more complex defect aggregates or via a dynamic exchange between mobile small defects and larger clusters or domains.
Journal title :
Journal of Nuclear Materials
Serial Year :
2004
Journal title :
Journal of Nuclear Materials
Record number :
1358343
Link To Document :
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