Author/Authors :
Usov، نويسنده , , I.O. and Won، نويسنده , , J. F. Devlin، نويسنده , , D.J. and Jiang، نويسنده , , Y.-B. and Valdez، نويسنده , , J.A. and Sickafus، نويسنده , , K.E.، نويسنده ,
Abstract :
A novel method for the fabrication of test samples for fission gas behavior studies is described. We applied the technique of ion beam assisted deposition (IBAD) as a means to introduce Xe atoms into alumina (Al2O3) films. We then investigated the redistribution of Xe atoms and microstructural evolution induced by annealing. Transmission electron microscopy analysis revealed that the microstructure of our Al2O3–Xe IBAD films resemble characteristic microstructural features associated with fission gas accumulation in reactor-irradiated nuclear fuels.
