Author/Authors :
Lozano-Perez، نويسنده , , S. and Kilburn، نويسنده , , M.R. and Yamada، نويسنده , , T. and Terachi، نويسنده , , T. and English، نويسنده , , C.A. and Grovenor، نويسنده , , C.R.M.، نويسنده ,
Abstract :
High-resolution analysis using a Cameca NanoSIMS 50 has been used to map the oxide chemistry in intergranular cracks in stainless steels. The technique has proven ideal for this type of sample, as it is able to discern between the different oxide layers and clarify the role of minor segregants such as boron and sulphur. Results are compared with analysis of the same sample by scanning auger microscopy and its interpretation discussed. The short time required to prepare and examine multiple regions present the NanoSIMS as an optimum tool for corrosion characterization.