Author/Authors :
Likonen، نويسنده , , J. and Vainonen-Ahlgren، نويسنده , , E. and Khriachtchev، نويسنده , , L. and Coad، نويسنده , , J.P. and Rubel، نويسنده , , M. and Renvall، نويسنده , , T. and Arstila، نويسنده , , K. and Hole، نويسنده , , D.E.، نويسنده ,
Abstract :
JET Mk-II Gas Box divertor tiles exposed in 1998–2001 have been analysed with various ion beam techniques, secondary ion mass spectrometry (SIMS) and Raman spectroscopy. Inner divertor wall tiles removed in 2001 were covered with a duplex film. The inner layer was very rich in metallic impurities, with Be/C ∼ 1 and H-isotopes only present at low concentrations. The outer layer contained higher concentrations of D than normal for plasma-facing surfaces in JET (D/C ∼ 0.4), and Be/C ∼ 0.14. Raman and SIMS analyses show that the deposited films on inner divertor tiles are hydrogenated amorphous carbon with low sp3 fractions. The deposits have polymeric structure and low density. Both Raman scattering and SIMS indicate that films on inner divertor wall Tiles 1 and 3, and on floor Tile 4 have some differences in the chemical structure of the deposited films
