Title of article
Refractive index measurements of planar chalcogenide thin film
Author/Authors
Laniel، نويسنده , , Jacques M and Ménard، نويسنده , , Jean-Michel and Turcotte، نويسنده , , Karine and Villeneuve، نويسنده , , Alain and Vallée، نويسنده , , Réal and Lopez، نويسنده , , Cédric and Richardson، نويسنده , , Kathleen A، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
9
From page
183
To page
191
Abstract
We report on the measurements of the refractive index of As–S–Se chalcogenide glasses near 1.55 μm. The measurements were made on annealed and non-annealed samples of thermally evaporated thin films. The data for two different series of glasses are presented: the compositions As40S60−xSex and the compositions AsxS(100−x)/2Se(100−x)/2 where the ratio of sulfur to selenium is kept constant (1:1). It has been found that replacing sulfur by selenium in the first series increases the refractive index from 2.4 to 2.8 and increasing the arsenic content in the second series increases the refractive index. In all cases, it has been found that annealing the samples increase the refractive index. The accuracy in the refractive index measurement is ±0.2%.
Journal title
Journal of Non-Crystalline Solids
Serial Year
2003
Journal title
Journal of Non-Crystalline Solids
Record number
1368684
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