Electrical resistivity evolution in the annealed amorphous Fe78Si9B13 ribbons

The electrical resistivity was measured at room temperature for the amorphous Fe78Si9B13 ribbons annealed at various temperatures for different holding time. Although the annealed Fe78Si9B13 ribbons are in full amorphous state, their electrical resistivity obviously varies with the annealing time. At every annealed temperature, the electrical resistivity evolution can be divided into regions I, II, and III, respectively. Using X-ray diffraction (XRD), scanning electron microscope (SEM), and differential scanning calorimetry (DSC), we investigated the ribbons overlapping regions I and II (called the focused ribbons, FRs). The results show that the change of electrical resistivity, fracture morphology, thermal effect in DSC analysis of the focused ribbons (FRs) can be ascribed to the evolution of the short range order (SRO) in the amorphous alloy.