Signatures of an extended rigidity percolation in the photo-degradation behavior and the composition dependence of photo-response of Ge–Te–In glasses

Time dependent photocurrent measurements have been undertaken on bulk Ge15Te85−xInx (1 ⩽ x ⩽ 11) series of glasses. It is found that samples with x < 3 do not exhibit any photo-degradation whereas a decrease in photo-conductivity under illumination is observed in samples with x ⩾ 3. Further, the photosensitivity of Ge15Te85−xInx glasses is found to reveal specific signatures at compositions x = 3 and 7. The observed composition dependent photo-degradation behavior and photo-response of these glasses have been understood on the basis of an extended rigidity percolation and its influence on network related properties.